Transmission Electron Microscopy Laboratory

The AIF Transmission Electron Microscopy Laboratories hosts three transmission electron microscopes (TEM), one sample preparation laboratory, and computer simulation function.

Surface Science Laboratory

Surface analysis laboratory has new instrumentation with a SPECS XPS and an ION-TOF TOF-SIMS V secondary ion mass spectrometer. These two instruments provide surface complementary surface analysis information.

Scanning Microscopy Laboratory

The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope.

X-Ray Diffraction Laboratory

The AIF X-ray Diffraction Laboratory currently hosts the Rigaku SmartLab X-ray diffractometer. Two additional instruments are scheduled to come online this summer.