Scanning Microscopy Laboratory

The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope.

Transmission Electron Microscopy Laboratory

The AIF Transmission Electron Microscopy Laboratory hosts three transmission electron microscopes (TEM), a Sample Preparation Facility and a Computer Simulation function.

Surface Science Laboratory

The AIF Surface Science Laboratory hosts new instrumentation: a SPECS XPS and an ION-TOF TOF.SIMS5 secondary ion mass spectrometer. These two instruments provide complementary surface analysis information.

X-Ray Diffraction Laboratory

The AIF X-ray Diffraction Laboratory currently hosts the Rigaku SmartLab X-ray diffractometer. Two additional instruments are scheduled to come online this summer.