Instrumentation and Facilities

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Surface Science Laboratory

The AIF Surface Science Laboratory hosts a new SPECS XPS system and an ION-TOF TOF.SIMS5. These two instruments provide complementary surface analysis information.

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Transmission Electron Microscopy Laboratory

The AIF Transmission Electron Microscopy Laboratory hosts three transmission electron microscopes, a Sample Preparation Facility and a Computer Simulation function.

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Scanning Microscopy Laboratory

The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electronn microscopes, and atomic force microscope and a dual beam focused ion beam/scanning electron microscope

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X-ray Diffraction Laboratory

The AIF X-ray Diffraction Laboratory currently hosts the Rigaku SmarLab X-ray diffractometer. Two additional instruments are scheduled to come online this summer.