Instrumentation and Facilities
Surface Science LaboratoryThe AIF Surface Science Laboratory hosts a new SPECS XPS system and an ION-TOF TOF.SIMS5. These two instruments provide complementary surface analysis information. |
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Transmission Electron Microscopy LaboratoryThe AIF Transmission Electron Microscopy Laboratory hosts three transmission electron microscopes, a Sample Preparation Facility and a Computer Simulation function. |
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Scanning Microscopy LaboratoryThe AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, and atomic force microscope and a dual beam focused ion beam/scanning electron microscope |
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X-ray Diffraction LaboratoryThe AIF X-ray Diffraction Laboratory currently hosts the Rigaku SmarLab, Panalytical Empyrean and Bruker AXS GADDS X-ray diffractometer. |