JEOL 2010F is a field emission ultra-high resolution scanning transmission electron microscope. It is capable of obtaining lattice resolution images with chemical composition information (EDS, EELS/GIF).

Equipment Specifications

High Voltage
  • 80, 100 kV, 120 kV, and 200 kV
Electron Source
  • Field emission gun (FEG): ZrO/W (100) Schottky type
  • Probe current: 0.5nA/1nm
Resolution
  • Ultra-high resolution pole piece
  • Lattice resolution: 0.1 nm
  • Point resolution: 0.19 nm
  • Information limit: 0.14 nm
Magnification
  • Standard Mode (MAG1): 2,000x to 1,500,000x
  • Selected area mode (SA): 8,000x to 800,000x
  • Low mag mode (LOW MAG): 50x to 6,000x
Aberration Coefficients
  • Spherical: 0.5 mm
  • Chromatic: 1.1 mm
Specimen tilt angle
  • ±20º
Specimen moving range
  • X- and Y- directions: ±1 mm
  • Z- direction: ±0.1 mm
Diffraction
  • Diffraction pattern in parallel beam
  • Convergent-beam electron diffraction (CBED)
  • Micro-diffraction
Specimen Holders
STEM Performance
  • Atomic resolution STEM Imaging at free-lens control mode
  • Magnification: LOW MAG: 100x to 8,000x, MAG: 10,000x to 8,000,000x
  • Detectors: high-angle annular dark field detector (HAADF)
 Spot size
  • TEM mode: 2 to 5 nm
  • EDS mode, NBD mode, and CBD mode: 0.5 to 2.4 nm
Attachments
  • Energy Dispersive Spectrometer (EDS) (Bruker Silicon Drift Detector-SDD)
  • Gatan Electron Energy-Loss Spectrometer (EELS): resolution 1.5 eV
  • Gatan Energy Filter (GIF) (Gatan 200)
Image Recording
  • Gatan Orius digital camera
  • Gatan MRC GIF digital camera
  • Gatan TV rate camera
  • Gatan DigitalMicrograph software
  • Gatan digiscan unit

Operation Instruction Manuals

JEOL 2000FX S/TEM Basic Operation Instruction Manual