The various short courses offered by AIF are designed to provide direct individual instruction for sample preparation and for hands-on operation of AIF instruments.  Although courses can be lengthened or shortened to meet the needs of the student, courses are designed to run from 4 or 5 days.  Course attendance is limited to a maximum of two students (price is the same for one or two students) to ensure the maximum transfer of knowledge via maximization of student/teacher interaction and to provide for sufficient hands on instrument time.  Limiting attendance to two students allows the course to be designed to give students the maximum possible opportunity for hands on operation of the instruments or, for back side polishing, to personally polish samples.  This approach gives the student the opportunity to learn the required skills, to put these skills into practice, to determine where any gaps in understanding may lie and to allow the teacher and student to rapidly and efficiently address these gaps.  Graduates of these courses leave with a Certificate of Graduation indicating that they have the practical knowledge required to successfully operate the instrument of interest or, in the case of back side polishing, to successfully polish the samples of interest.  Since most students interested in taking these courses are doing so to gain sufficient practical understanding and skills to analyze samples directly related to their work or field of study, students are encouraged to bring samples that they need to analyze so that the skills that they learn can be directly applied to the sample types in which they are interested. Students will receive digital versions of course material used during the class.

To register for courses or to receive more information, please contact AIF.

Location

The NC State Centennial campus is located just 15 minutes from the Raleigh (RDU) airport.  There are several local hotels within minutes from the campus for lodging. Please ask and we will be happy to make recommendations.

Basic AFM Operation

The AFM Basic Operator Course is a 4 day basic course (variable length customized courses available) covering basic operation of atomic force microscopy. The AFM Basic Operator Course is limited to 2 students to ensure that sufficient hands-on instrument time is available.  This course prepares the student for AFM analysis of samples by providing an overview of AFM and hands on training in the operation thereof.  Available AFM equipment includes Asylum MFP-3D, JEOL JSPM-5200, and Veeco courses available) covering advanced operation of scanning probe microscopes including AFM, STM, fluid cell AFM, and understanding SPM signals.  The AFM Advanced Operator Course is limited to 2 students to ensure that sufficient hands-on instrument time is available.  This course prepares the student for AFM analysis of samples by providing advanced training in SPM techniques.  Available AFM equipment includes the Bruker Dimension 3000, Asylum MFP-3D, JEOL JSPM-5200, and Veeco D3100 and Multimode AFM’s.

Advanced SPM Operation

nanofibersThe SPM advanced Operator Course is a 4 day course (customized courses with variable length are available). The course covers advanced operation of scanning probe microscopes including AFM, STM, fluid cell AFM, and understanding SPM signals. The AFM Advanced Operator Course is limited to 2 students to ensure that sufficient hands-on instrument time is available. This course prepares the student for AFM analysis of samples by providing advanced training in SPM techniques. Available AFM equipment includes the Bruker Dimension 3000, the Asylum MFP-3D, JEOL JSPM-5200, and Veeco D3100 and Multimode AFMs.

Basic SEM Operation

The Basic SEM Operator Course is a 4 day course (customized courses with variable length are available). The course covers the basic operation of both the variable pressure SEM and the field emission SEM.  This course is limited to two students to ensure that sufficient hands on instrument time is available.  The basic principles of these two types of SEM will be reviewed as well as the advantages of each.  Hands on training in the operation of the Hitachi S-3200N variable pressure SEM and JEOL JSM 6400F field emission SEM will be given with emphasis placed on selection and adjustment of instrument operating parameters.

Advanced SEM/EDS Operation

The Advanced SEM Operator Course is a a 4 day course (customized courses with variable length are available). The course covers the basics of electron beam interaction with solids and the signals produced which are available for use for materials characterization.  This course is limited to two students to ensure that sufficient hands-on instrument time is available.  This course will focus on understanding of Energy Dispersive Spectroscopy (EDS) data acquisition and interpretation and on imaging of difficult samples such as insulators and beam sensitive samples.  For EDS, emphasis will be placed on understanding of data acquisition parameters and their impact on data and on data interpretation and analysis.  X-ray mapping and linescan profiles will also be taught. Techniques for high resolution imaging of charging and beam sensitive samples will be explained and implemented.  Sample preparation methods will be shown depending on the users needs.

Backside Polishing for SIMS

BSP sample viewed with 690nm red filter

BSP sample viewed with 690nm red filter

The Backside Polishing for SIMS Sample Preparation Course is a 4 day course (variable length customized courses available) covering the methods and materials used for the preparation of samples using the Back Side Polishing Method as developed by AIF. The course is limited to a maximum of 2 students to ensure that sufficient hands-on polishing time is available.  This is a hands on course where the student will learn the procedure for preparation of back side samples.  Samples must be provided by the student and can be blanket and site specific samples.  A written step by step procedure will be provided along with a listing of tools required as well as a listing of and specifications for the various jigs, sample holders, etc needed for the polishing process.

Basic Metallography

Normarski Image of recrystallized Pt

Normarski Image of recrystallized Pt

The Metallography Course is a 3 day course (variable length customized courses available) covering the methods and materials used for the preparation of samples for optical and/or scanning electron microscopy. The techniques shown will be sectioning, embedding, grinding, polishing and etching. Samples will also be examined under the optical microscope. Contact profilometery will also be shown if desired. The course is limited to a maximum of 2 students to ensure that sufficient hands-on polishing time is available.  This is a hands-on course where the student will learn by doing the required tasks. Samples must be provided by the student.