Tutorial Workshop: Soft Materials

Hosted by NCSU’s Analytical Instrumentation Facility (AIF), this workshop will cover topics related to characterization and analysis of soft materials using analytical techniques at AIF. A series of five 15 minute talks featuring examples and instrumentation available at AIF will be presented by staff experts. A facility tour will be offered after the talks. Please register using the form below.

 

Date Friday, November 22nd, 2013
Time 1:00 PM – 4:00 PM
Location 136 Monteith Research Center, Centennial Campus of North Carolina State University

 

Schedule Topic Instrumentation Presenter
1:00 – 1:20 Surface Analysis (XPS, SIMS) SPECS XPS/UVS, IONTOF TOF SIMS Elaine Zhou
1:20 – 1:40 X-ray Diffraction Rigaku SmartLab, PANalytical Empyrean James Tweedie
1:40 – 2:00 Focused Ion Beam (FIB-SEM) FEI Quanta 3D FEG Chuck Mooney
2:00 – 2:20 Break  
2:20 – 2:50 Cryo Ultramicrotome Leica UC7 Roberto Garcia
Transmission Electron Microscopy FEI Titan 80-300JEOL 2010FJEOL 2000FX
3:00 – 4:00 Facility Tour

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