Tutorial Workshop: In-situ Materials Characterization Techniques

Featuring technical presentations and demonstrations related to in-situ transmission electron microscopy and X-ray diffraction.

Date Wednesday, November 6, 2013
Time 2:00 PM to 5:30 PM
Location 246 Monteith Research Center, Centennial Campus of North Carolina State University


2:00-2:45 Technical seminar on In-situ Electron Microscopy

“Current and future perspectives on in situ TEM using semiconductor-based active sample supports” – John Damiano, Protochips Inc.


The idea of in situ experiments in the electron microscope is nearly as old as the instrument itself, and only recently have commercial in situ systems emerged to analyze materials under reaction conditions at the nano and atomic scale.  Creating tools for in situ TEM is challenging mainly due to the confined area in the column and small pole piece gaps frequently found in modern microscopes.  To address this problem, semiconductor fabrication techniques are being used to create devices with a high level of functionality in a small package. These techniques enable large-scale, reliable fabrication of closed cells that form the foundation of in situ liquid and gas systems.  Recent results demonstrating atomic-resolution imaging and analysis at high temperatures and in liquid environments will be presented.

2:45-3:30 Technical seminar on In-situ X-ray Diffraction


3:30-5:30 Concurrent Laboratory Demonstrations and Q&A


Instrument Technique Location
Titan Aberration Corrected STEM In-situ Heating 122 MRC
Quanta 3D SEM/FIB In-situ Heating 119 MRC
JEOL 2010F TEM Liquid Cell TEM 1046A EB1
PANalytical Empyrean XRD In-situ Heating 303 MRC