Tutorial Workshop: In-situ Materials Characterization Techniques
Featuring technical presentations and demonstrations related to in-situ transmission electron microscopy and X-ray diffraction.
|Date||Wednesday, November 6, 2013|
|Time||2:00 PM to 5:30 PM|
|Location||246 Monteith Research Center, Centennial Campus of North Carolina State University|
2:00-2:45 Technical seminar on In-situ Electron Microscopy
“Current and future perspectives on in situ TEM using semiconductor-based active sample supports” – John Damiano, Protochips Inc.
The idea of in situ experiments in the electron microscope is nearly as old as the instrument itself, and only recently have commercial in situ systems emerged to analyze materials under reaction conditions at the nano and atomic scale. Creating tools for in situ TEM is challenging mainly due to the confined area in the column and small pole piece gaps frequently found in modern microscopes. To address this problem, semiconductor fabrication techniques are being used to create devices with a high level of functionality in a small package. These techniques enable large-scale, reliable fabrication of closed cells that form the foundation of in situ liquid and gas systems. Recent results demonstrating atomic-resolution imaging and analysis at high temperatures and in liquid environments will be presented.
2:45-3:30 Technical seminar on In-situ X-ray Diffraction
3:30-5:30 Concurrent Laboratory Demonstrations and Q&A
|Titan Aberration Corrected STEM||In-situ Heating||122 MRC|
|Quanta 3D SEM/FIB||In-situ Heating||119 MRC|
|JEOL 2010F TEM||Liquid Cell TEM||1046A EB1|
|PANalytical Empyrean XRD||In-situ Heating||303 MRC|