The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope. The first of the SEMs is a Hitachi S3200N variable pressure SEM with an energy dispersive x-ray spectrometer. The second SEM is a high resolution JEOL 6400F cold field emission SEM. The scanning probe microscope (AFM) is a Bruker Dimension 3000. The Dual Beam FIB-SEM is a FEI Quanta 3D FEG. It has a Schottky field emission SEM column for high resolution imaging and a gallium liquid metal ion source FIB for nanofabrication and imaging.