AIF will offer TEM short course in a regular basis. Please check the recent news for upcoming course.
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 2 hours theory component (taught by Prof. James LeBeau) on Wednesday Morning (8:30 am to 10:30 am), and the rest of the day will be laboratories.
This introductory course will cover the following topics:
- Basic principles of TEM.
- Basic Diffraction and Imaging.
- Introduction of the advanced characterization techniques.
After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.
|Date||Wednesday, May 28th, 2014|
|Time||8:30 am – 5:00 PM|
|Location||Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University|
|Cost||NCSU student $50; non-profit $150; industry $350|
For more details and to register, please contact Dr. Yang Liu at his email firstname.lastname@example.org.
Course limited to 10 people.