The AIF X-ray Diffraction Laboratory currently hosts the Rigaku SmartLab X-ray diffractometer. Two additional instruments are scheduled to come online this summer. The first is a Bruker AXS General Area Detector Diffraction System (GADDS), which facilitates rapid analysis of thin films, powders, and fibers. The second instrument is a state-of-the-art PANalytical Empyrean diffractometer. It will be equipped with heated stages that will allow in situ measurements of annealing experiments.