Mar 31th, 2017 – Special topic in TEM: EFTEM Workshop

Energy Filter TEM

NCSU’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The second workshop in the Spring of 2017 will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:

  1. Fundamentals of EFTEM
  2. Practical setup of EFTEM acquisition
  3. EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
  4. EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges
Date Friday, March 31th 2017
Time 8:30 am – 5:30 pm
Location EB1, Rm1046, NCSU Centennial Campus
Instructor Dr. Yang Liu
Registration cost Students and non-profits: $50; industry: $350

For more details and to register, please contact Dr. Yang Liu at his email To insure each participant receives a maximum of time, the workshop will be limited to 6 participants.