Introduction to Asylum Research AFM Image Data Processing & Analysis

Did you miss the Introduction to Asylum Research AFM Image Data Processing & Analysis seminar on April 23? You can now watch it by clicking the video below.

This virtual online seminar provided an overview of basic data processing protocols for AFM image data collected from RTNN’s many Oxford Instruments Asylum Research AFMs to enhance user presentation capabilities.

Processing steps like flattening, plane fitting & masking are shown. Analysis procedures such as line sections, roughness reports, & histogram generation were also demonstrated. A brief overview of the 3D & 4D rendering software was introduced.