Atomic Force Microscope (AFM)
Atomic force microscopy involves using a cantilever with a nanometer-scale tip to scan the specimen surface for local structure and properties.
The AIF just acquired a new Asylum MFP-3D classic Atomic Force Microscope (AFM). The instrument comes with a variety of advanced capabilities, including variable magnetic field module for in- and out-of-plane measurements, a probe station adapter for concurrent 2- and 3-point probe electrical measurements, viscoelastic mapping mode, conductive AFM, and a closed fluid cell for measurement in gases or liquids. This instrumentation acquisition was enabled by the Office of Research, Innovation and Economic Development (ORIED).
Questions? Contact Chuck Mooney at firstname.lastname@example.org.
Location: MRC room 307