Please join us to congratulate Kun Fu from College of Textile, and (Joseph) Houston Dycus from Materials and Science Engineering to receive AIF 2013 best paper award. Their research work involves employing many analytical instruments housed at AIF.
PI: Philip Bradford
First author: Kun Fu
Quote from the manuscript: “Characterization: The morphologies of the samples were investigated using a field emission scanning electron microscope (FE-SEM, JEOL 6400F) and transmission electron microscope (TEM, HITACHI HF2000, accelerating voltage 200 kV). The crystallographic and chemical structures were studied using wide angle X-ray diffraction (WAXD, Rigaku Smartlab) and a Renishaw Raman microscope (514 nm). Compositions of samples were examined by variable pressure scanning electron microscope (VPSEM) equipped with energy-dispersive X-ray spectroscopy (EDS).”
Applied Physics Letters
PI: Jim LeBeau
First author: (Joseph) Houston Dycus
Quote from the manuscript: “In this Letter, an aberration corrected scanning transmission electron microscope equipped with a state-of-the-art energy dispersive x-ray spectrometer is used to analyze the structure and chemistry of the interface between Bi2Te3 grown by metallorganic chemical vapor deposition (MOCVD) on GaAs substrates.”