Feb 28th, 2018 – Energy Filtered TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. On Feb. 28th, the workshop will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:

 

  1. Fundamentals of EFTEM
  2. Practical setup of EFTEM acquisition
  3. EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
  4. EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges

 

Date Wed, Feb 28th, 2018
Time 9:00 am – 5:00 PM
Instructor Dr. Yang Liu
Location Lab: Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. To insure each participant receives a maximum of time, the workshop will be limited to 6 participants.

Feb 9th, 2018 – SEM Short Course

SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants.

Date Friday, Feb 9th, 2018
Time 8:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.

If there is enough demand, additional course dates can be added.

Feb 2nd, 2018 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours theory component on Morning (9:00 am to 11:o0 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic Diffraction and Imaging.
  3. Introduction of the advanced characterization techniques.

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

 

Date Friday, Feb 2nd, 2018
Time 9:00 am – 5:00 PM
Location Lab: Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University (Lecture location is to be determined)
Cost NCSU student $50; non-profit $50; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu.