Users – NCSU

  1. Go to Mendix website at
    • Log in using your NCSU unity ID
    • Click “My Agreement” icon and send agreement request to your PI via Mendix
    • For questions regarding to Mendix system, please use the support website
  2. If you would like to be trained for any instrument, please complete AIF Safety Training and send email to Anna at to let her know you pass the training
  3. Request individual instrument training via Mendix. Click the training icon and choose the instrument you would like to be trained. Please specify the time you are available. In the same time, send an email to the lab manager for training request.
  4. Review the Training Plan for the specific lab of interest
    • Surface Science Laboratory
    • Scanning Microscopy Laboratory
    • TEM Laboratory
    • X-ray Diffraction Laboratory – Before XRD training, New Users are required by Environmental Health and Safety to complete the Analytical X-ray Safety course. Please take the class “Analytical X-ray Safety – EHPS-RS200”.
  5. Read and sign lab use policy and return the signed copy to lab or instrument manager

Users – External/Industry

  1. If you have technical questions, please click Contact AIF, or contact a Lab Manager directly.
  2. If you have any other questions including setting up service order form and billing, please contact Tanzania Ray. She can be reached at 919 515-9588 or through email

Door Access to AIF

  1. AIF requires documentation for all AIF door access requests.
  2. After you become a qualified independent user for a specific lab, please complete the AIF Door Access Request form and bring it along with your NCSU ID card to Anna Ragsdale in MRC 318.

After-Hours Access to AIF

  1. PI must complete the AIF After Hours Access Form
  2. The completed After-Hours Access Form should be submitted to the Anna Ragsdale of the specific lab to which the user is applying for access

AIF Instrumental Technique Description

If you are not familiar with various analytical tool hosted at AIF, please click the link for individual technique description written by AIF staff. These technique descriptions are aimed to new users and can provide a general guideline.

Scanning Electron Microscopy (SEM)

X-ray Photoelectron Spectroscopy (XPS)

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Focused Ion Beam (FIB)

X-Ray Diffraction (XRD)

Transmission Electron Microscopy (TEM)


Atomic Force Microscopy (AFM)

Acknowledgement Statement for User Publications

Publications that include results obtained at AIF should acknowledge the Facility with this statement:

This work was performed in part at the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-1542015). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).

After your results have been published, please submit bibliographic information via the Contact Us page.