By itecsadminThe AIF X-ray Diffraction Laboratory provides access to 3 state-of-the-art X-ray diffractometers including Rigaku SmartLab X-ray diffractometer, PANalytical Empyrean and Bruker AXS General Area Detector Diffraction System. |Facilities
By James TweedieThe AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope. |Facilities
By James TweedieThe AIF Surface Science Laboratory hosts new instrumentation: a SPECS XPS and an ION-TOF TOF.SIMS5 secondary ion mass spectrometer. These two instruments provide complementary surface analysis information.