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X-Ray Diffraction Laboratory

The AIF X-ray Diffraction Laboratory provides access to 3 state-of-the-art X-ray diffractometers including Rigaku SmartLab X-ray diffractometer, PANalytical Empyrean and Bruker AXS General Area Detector Diffraction System.

Transmission Electron Microscopy Laboratory

The AIF Transmission Electron Microscopy Laboratory hosts three transmission electron microscopes (TEM), a Sample Preparation Facility and a Computer Simulation function.

Scanning Microscopy Laboratory

The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope.

Surface Science Laboratory

The AIF Surface Science Laboratory hosts new instrumentation: a SPECS XPS and an ION-TOF TOF.SIMS5 secondary ion mass spectrometer. These two instruments provide complementary surface analysis information.