The JEOL JSM-7600F SEM outfitted with a cryogenic transfer system and stage can be used to evaluate hydrated samples without the need for drying, making it an ideal imaging tool for volatile or beam-sensitive samples in the areas of life, food, and polymer sciences. AIF is partnering with the CALS Center for Electron Microscopy on cryogenic specimen preparation for research done in conjunction with this microscope.

 

Equipment Specifications

Detectors
  • Upper secondary electron detector
  • Lower secondary electron detector
  • Low-angle backscattered electron detector
Electron Landing Energy
  • 100 eV – 30 keV
Magnification
  • 25X – 1MX
Resolution (SE)
  • 1.0 nm from 15 kV to 30 kV
  • 1.5 nm @ 1kV in Gentle Beam mode
  • 2.5 nm @ 1kV in SEM mode
Working Distance
  • 1.5 – 25 mm focusable
Specimen Stage
  • Eucentric tilt -5° to +70º
  • Rotate 360º (Rotation prohibited for cryo-stage)
  • x = ±70 mm
  • y = ±50 mm
  • z = 38 mm
Gatan Alto Cryo-transfer System
  • Variable temperature cold stage
  • Anti-contaminator
  • Cold knife fracture device
  • Cold magnetron sputter coater

Documentation

Alto cryo SEM user guide

Cryosem general experiment description

Instrument Photograph and Examples

 

photo 2

JEOL JSM-7600F with Gatan Alto-2500

 

Gatan Alto-2500 Cryo Transfer System

Gatan Alto-2500 Cryo Transfer System

 

Cryogenically Frozen Low Fat Mayonnaise

Cryogenically Frozen Low Fat Mayonnaise (Courtesy of Gatan, Inc)

 

Cryogenically Frozen Chloroplast. (Courtesy of Gatan, Inc)

Cryogenically Frozen Chloroplast. (Courtesy of Gatan, Inc)

 

 

Documents

JOEL 7600 CryoSEM Operation Manual