The JEOL 2000FX Scanning Transmission Electron Microscope (STEM) at NCSU satisfies researchers with high quality imaging in diffraction contrast, diffraction patterns (including convergent-beam electron diffraction, micro-diffraction), in-situ experiments (heating, cooling, tensile). It is also used at low kV to study biological samples. In most of the case, training for graduate students starts from this instrument.

Equipment Specifications

High Voltage
  • 80 kV, 100 kV, 120 kV, 160 kV, and 200 kV
Electron Source
  • Lanthanum Hexaboride (LaB6)
  • Lattice resolution: 0.14 nm;
  • Point resolution: 0.28 nm
  • Standard Mode (MAG1): 1,000x to 850,000x in 30 steps
  • Selected area mode (SA): 3,400x to 410,000x in 22 steps
  • Low mag mode (LOW MAG): 50x to 1,000 in 14 steps
Aberration Coefficients
  • Spherical: 2.3 mm
  • Chromatic: 2.2 mm
Beam size
  • 2.0 nm to 1 μm in diameter
Specimen moving range
  • X- and Y- directions: ±1 mm
  • Z- direction: +0.2, -0.3 mm
Specimen tilt angle
  • ±30º
  • Diffraction pattern in parallel beam
  • Convergent-beam electron diffraction (CBED)
  • Micro-diffraction
  • Hollow-cone generator
Specimen Holders
  • Single-tilt holder: double position quick exchange holder
  • Double-tilt holders: Gatan double-tilt holder, and JEOL double-tilt holder
  • Single-tilt rotation holder
  • Cooling stage: cooled by liquid nitrogen (lower than -160ºC)
  • Tensile stage
STEM Performance
  • Resolution: 1.0 nm
  • Magnification: STEM: 1,000x to 800,000x in 30 steps, SEM: 20x to 800,000x in 47 steps
  • Micro-area electron diffraction minimum area: 10 to 40 nm
  • Detectors: Secondary electron detector, annular dark field detector (ADF)
  • Energy Dispersive Spectrometer (EDS) (4 Pi Company)
Image Recording
  • Gatan digital camera
  • Gatan TV rate camera
  • Gatan DigitalMicrograph software
  • 4 Pi revolution software for STEM Image record and EDS experiment

Operation Instruction Manuals

JEOL 2000FX S/TEM Basic Operation Instruction Manual