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Advanced TEM Analysis: Imaging and Diffraction Workshop with Gatan and AIF
March 2 @ 9:00 am - 3:30 pmFree
Join Gatan and the Analytical Instrumentation Facility (AIF) at NC State University for a hybrid workshop featuring advanced capabilities and techniques in the realm of imaging and diffraction.
Learn how large-format, high-speed cameras can transform a transmission electron microscope (TEM) into a high-throughput, data-generating machine. See how high-speed diffraction experiments like 4D STEM are changing the landscape of electron microscopy by introducing new capabilities like differential phase contrast (DPC) imaging, electric field mapping, and much more. This workshop will cater to new and expert users alike, from routine TEM experiments to advanced in-situ analysis and sophisticated diffraction research.
You can attend this workshop in person or virtually. Please select one option below to register. If you need a parking pass for the MRC parking deck, please indicate so in the registration form.
Registration for Workshop (In Person)
Registration for Workshop (Virtual)