The Analytical Instrumentation Facility is now offering a virtual short course on
scanning electron microscopy (SEM). In addition to two lectures on practical
SEM operation there will be a live (virtual) demonstration of the operation of a
conventional thermal emitter SEM that will show how changing beam parameters
affects the resulting data. The goal of the course is to provide students a basic
knowledge of both the theory and practice of SEM imaging, the data that can be
derived thereof, and to understand what the generated data means. This course
counts toward one of the three training sessions that are required for hands-on
use of the AIF Hitachi S-3200N VPSEM. Since the course is virtual, there is no
limit to the number of registrants. For more details and to register, please
contact Chuck Mooney at cbmooney@ncsu.edu.