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SEM Short Course

April 14, 2023 @ 9:00 am - 5:00 pm

The Analytical Instrumentation Facility is now offering a short course on practical scanning electron microscopy (SEM). The goal of the course is to provide students basic practical knowledge of SEM imaging and elemental analysis (EDS). Participants will be encouraged to attend in person (in person is required for hands-on SEM time). A virtual lecture feed can be provided upon request.

The first part of the course will be free of charge and will consist of two lectures and a live SEM demonstration. The lectures will include information on how to make and control an electron beam (aka electron optics), what happens when the electron beam strikes a sample, how to choose electron beam parameters (energy, current, etc.), what signals result from the interaction of the electron beam with the sample, how are those signals detected, and what does that data mean. This will include information on both SEM imaging and elemental analysis (energy dispersive X-ray spectroscopy).

The second part of the course is hands-on. Each student is given the option of buying an hour ($50) of hands-on time with an expert operator to observe/analyze samples of their choice in either (or both) the AIF variable pressure or ultra-high resolution SEMs.

There will also be a day of practical hands-on instrument time where lecture participants will be allowed to sign up to use an SEM themselves to observe their own samples.  Participants will be charged for hands-on instrument time ($50 for students). For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.

Details

Date:
April 14, 2023
Time:
9:00 am - 5:00 pm
Event Categories:
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Venue

454 Monteith Research Center
2410 Campus Shore Drive, Room 454, Monteith Research Center (MRC)
Raleigh, NC 27606 United States
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Phone
9195158887

Organizer

Chuck Mooney
Phone
919-515-2348
Email
cbmooney@ncsu.edu