NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for new TEM users with an interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours of theory component (9:00am to 11:00am) and the rest of the day will be in laboratories.

This introductory course will cover the following topics:

1. Basic principles of TEM
2. Basic diffraction and imaging
3. Introduction of advanced characterization techniques

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

For more details and to register, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

Industry: $350