Feb 17th, 2017 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Date Friday, Feb 17th, 2017
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350


For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu

Course limited to 6 people.