NCSU’s Analytical Instrumentation Facility (AIF) is kicking off our first Analytical Inquiry Friday (AIF) on Feb 19th, 2016. This Inquiry Friday is meant for those who are interested in getting to know the analytical techniques. Attendants are welcome to bring their own samples to run during the session.
Our first Analytical Inquiry Friday will open surface analytical tool XPS and TOF SIMS in the morning and XRD in the afternoon.
|Date||Friday, Feb 19th, 2016|
|Time||9:00 am – 12:00 pm (XPS and TOF SIMS)
1:00 pm – 4:00 pm (XRD)
|Location||318 Monteith Research Center, Centennial Campus of North Carolina State University|
For XPS and TOF SIMS registration, please contact Elaine Zhou at firstname.lastname@example.org
For XRD registration, please contact Ching-Chang Chung at email@example.com