A meeting of the FIB Users Group was held at 10 am on Tuesday, June 18 2013 in Room 136 MRC. This was followed at 11 am by a 2-part lecture on new technologies in nanofabrication from Carl Zeiss Microcroscopy. Lunch was provided to registered attendees after the lecture
|Date||JUNE 18, 2013|
|Time||10:00 – 11:00 FIB Users Group Meeting11:00 – 12:00 Carl Zeiss Microscopy Seminars12:00 – 1:00 Lunch|
|Location||Monteith Research Center Bldg. Room 136
Centennial Campus – North Carolina State University
Lunch & Learn with Carl Zeiss
“Advanced Gallium Focused Ion Beam Applications” will explore new holders for the preparation of TEM samples, advanced three-dimensional sample analyses, extreme field of view imaging, and laser milling applications.
“Helium and Neon FIB Microscopy for Sub-10nm Nanofabrication Applications” will cover the new possibilities with ion microscopy. Learn about nanofabrication with highly sensitive materials, such as graphene, creation of solid state nanopores for DNA sequencing, direct write lithography down to 4nm, and deposition of conducting and insulating materials using inert ion species.
|Account Manager||BILL FAUGHT|