NCSU’s Analytical Instrumentation Facility (AIF) is giving a XRD short course specialized in advanced X-ray analysis methods using Eulerian Cradle, and in situ XRD measurements using non-ambient stages. These advanced characterization techniques are very useful to investigate thin film/crystal quality, orientation relation between film and substrate, texture, thermal expansion, crystallization reactions, and phase transition studies. The course will include 1.5 hour theory component (taught by Dr. Ching-Chang Chung) on Thursday Morning (9 am to 10:30 am), and the rest of the day will be in the XRD lab.
This short course will cover the following topics:
- Introduction of different characterization techniques using an Eulerian Cradle. This includes Rocking Curve, Reciprocal Space Mapping, Phi Scan, and Pole Figure measurements.
- Introduction of in situ XRD measurements using non-ambient stages.
- Lab Sessions
After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do advanced X-ray analysis methods using an Eulerian Cradle and different non-ambient stages, and how to optimize/design their own experiments for their projects.
|Date||Thursday, May 28th, 2015|
|Time||9:00 am – 5:00 PM|
|Location||324 Monteith Research Center, Centennial Campus of North Carolina State University|
|Cost||NCSU student $50; non-profit $50; industry $350|
For more details and to register, please contact Dr. Ching-Chang Chung at his email email@example.com
Course limited to 10 people.