Tutorial Workshop: Soft Materials
Hosted by NCSU’s Analytical Instrumentation Facility (AIF), this workshop will cover topics related to characterization and analysis of soft materials using analytical techniques at AIF. A series of five 15 minute talks featuring examples and instrumentation available at AIF will be presented by staff experts. A facility tour will be offered after the talks. Please register using the form below.
Date | Friday, November 22nd, 2013 |
Time | 1:00 PM – 4:00 PM |
Location | 136 Monteith Research Center, Centennial Campus of North Carolina State University |
Schedule | Topic | Instrumentation | Presenter |
---|---|---|---|
1:00 – 1:20 | Surface Analysis (XPS, SIMS) | SPECS XPS/UVS, IONTOF TOF SIMS | Elaine Zhou |
1:20 – 1:40 | X-ray Diffraction | Rigaku SmartLab, PANalytical Empyrean | James Tweedie |
1:40 – 2:00 | Focused Ion Beam (FIB-SEM) | FEI Quanta 3D FEG | Chuck Mooney |
2:00 – 2:20 | Break | ||
2:20 – 2:50 | Cryo Ultramicrotome | Leica UC7 | Roberto Garcia |
Transmission Electron Microscopy | FEI Titan 80-300, JEOL 2010F, JEOL 2000FX | ||
3:00 – 4:00 | Facility Tour |