Surface Science Lab Manager; Safety Officer
- Phone: 919-515-7037
- Email: firstname.lastname@example.org
- Office: Monteith Engineering Res.Ctr. 318B
- Website: https://scholar.google.com/citations?hl=en&user=AFACFF4AAAAJ&view_op=list_works
Fred Stevie is a Senior Researcher at the Analytical Instrumentation Facility and is manager of the Surface Analysis Laboratory which includes X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) instrumentation. His other area of involvement is with Focused Ion Beam (FIB).
His experience with materials characterization spans more than 40 years, principally with Bell Laboratories where he reached the highest technical level (Consulting Member of Technical Staff). Most of his work has been with SIMS and FIB. His contributions to the SIMS field cover a wide range of topics that include quantification, characterization of ion implantation, topography formation, identification of surface and interfacial contaminants, back side analysis, polymer interfaces, and insulator analysis. His FIB studies investigate FIB-SIMS and FIB sample preparation for an array of analytical techniques. He has assisted numerous students in dissertation work and is currently teaching students in the use of XPS and FIB instrumentation. He is also a Research Professor of Materials Science at University of Central Florida.
Fred has authored or co-authored more than 200 publications, including books on SIMS depth profiling and FIB. He has made over 200 technical presentations, many of them invited talks, and holds 20 patents. Fred is a fellow of the American Vacuum Society (AVS) and AVS course instructor for SIMS and FIB. He is on the advisory board for Surface and Interface Analysis and is Associate Editor for Surface Science Spectra. He is an active member of AVS and ASM and has been involved with the organization of many technical meetings. He received a M.S. degree in physics from Vanderbilt University in 1970.