Malvern PANalytical and the RTNN hosted a “Non-ambient X-ray Diffraction (XRD)” workshop at NC State on November 8th and 9th, 2017. The event brought together 48 attendees from 17 different universities and organizations to explore the research potential of non-ambient diffraction and practical advice for collecting accurate and useful data. On the evening of November 8th, attendees learned more about on-going research during a poster session.

The picture shows Dr. Tom Blanton, the executive director of International Centre for Diffraction Data (ICDD), presenting his work on ‘Materials Characterization using the ICDD  PDF-4+’.