Recent Posts

Surface Analysis (XPS and ToF-SIMS) Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory...

2018 AIF Open House & User Appreciation

  Please join us for our annual Open House & User Appreciation. During this time, we’ll have an introduction for new users (presented by Dr....

SEM Short Course

We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student...