Recent Posts

Surface Analysis (XPS and ToF-SIMS) Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory...

2018 AIF Open House & User Appreciation

  Please join us for our annual Open House & User Appreciation. During this time, we’ll have an introduction for new users (presented by Dr....

New NSF award to acquire $1M nano-imaging instrument

  The instrument is anticipated to cost nearly $1M, with nearly $700k coming from the NSF and remainder in cost-sharing from NC State. Jacob Jones,...