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FIB Short Course

The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB, as well...

Surface Analysis (XPS and ToF-SIMS) Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory...

SEM Short Course

We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student...

FIB Short Course

FIB Short Course AIF is going to offer another FIB short course on July 20th, 2018. The FIB short course includes lectures covering an introduction...