Aberration Corrected STEM – ThermoFisher Titan 80-300
The ThermoFisher Titan 80-300 probe aberration corrected scanning transmission electron microscope (STEM) with monochromator is an advanced analytical workstation:
- The field emission electron source (X-FEG) delivers high density and high coherent electron beam.
- The three-condenser lens system ensures a nanometer size parallel electron beam generated.
- The Super-X energy dispersive x-ray spectrometry (EDS) system uses 4 windowless silicon drift detectors to ensure high x-ray collection efficiency, even for light elements.
- The combination of X-FEG and SuperX EDS together is called ChemiSTEM Technology, which makes elemental mapping at atomic level possible.
- The monochromator makes sure the energy resolution of the electron source is as high as 0.2 eV, which allows electron energy-loss spectrum (EELS) to be collected at atomic level.
- Tomography function allows 3-Dimensional re-construction.
Questions? Contact Chris Winkler at crwinkler@ncsu.edu.
Location: MRC room 122
Equipment Specifications
High Voltage |
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Resolution |
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Energy Resolution |
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Sample holders |
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Attachments |
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Software |
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Fast Atomic EELS Map of GaAs