Recent Posts
June 18th – Zeiss Lecture and FIB Users meeting
A meeting of the FIB Users Group was held at 10 am on Tuesday, June 18 2013 in Room 136 MRC. This was followed at...May 22nd – New Technique May Open Up an Era of Atomic-scale Semiconductor Devices
Scanning Microscopy Laboratory
The AIF Scanning Microscopy Laboratory is comprised of 2 scanning electron microscopes, an atomic force microscope and a dual beam scanning focused ion beam/scanning electron microscope.