Material Characterization Techniques

If you are not familiar with the various analytical instruments available at AIF, please click the link for the specific individual technique description written by AIF staff. These technique descriptions are aimed to new users and can provide a general guideline.

Scanning Electron Microscopy (SEM)

X-ray Photoelectron Spectroscopy (XPS)

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Focused Ion Beam (FIB)

X-Ray Diffraction (XRD)

Transmission Electron Microscopy (TEM)


Atomic Force Microscopy (AFM)