Material Characterization Techniques

If you are not familiar with various analytical tool hosted at AIF, please click the link for individual technique description written by AIF staff. These technique descriptions are aimed to new users and can provide a general guideline.

Scanning Electron Microscopy (SEM)

X-ray Photoelectron Spectroscopy (XPS)

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Focused Ion Beam (FIB)

X-Ray Diffraction (XRD)

Transmission Electron Microscopy (TEM)


Atomic Force Microscopy (AFM)