May 6th 2016 – Basic Vacuum Technology Short Course

 

Date Friday, May 6th, 2016
Time  8:30 am – 5:00 pm
Location Monteith Research Center, Rm 320 (NCSU Centennial Campus)
Instructor Fred Stevie
Registration Cost Free (Sponsored by RTNN)

This is primarily a hands on course with some lecture time. Individuals will work on two functioning vacuum systems. Each attendee will manually remove and install components to learn practical knowledge when dealing with vacuum systems. Covered components include forepumps, turbomolecular pumps, ion pumps, thermocouple and cold cathode gauges, valves, flanges, and feedthroughs.

In addition to hands-on instruction, attendees will receive the following:

  • Digital copy of lecture materials
  • Tour of AIF facility

 

The course instructor will be Fred Stevie. Fred has 40 years of experience with vacuum instrumentation and is an American Vacuum Society instructor. He is currently responsible for the Surface Analysis Laboratory at NC State.

 

Apr 22nd, 2016 – Ultramicrotomy of Polymers Workshop

Ultramicrotomy of Polymers Workshop

The Analytical Instrumentation Facility (AIF) is presenting a 1 day workshop on the Ulramicrotomy of Polymers. Attendees will get hands on experience using the equipment and preparing the samples to cut. Also discussed will be sample preparation, analysis and cryoultramicrotoy. Attendees are encouraged to submit their own samples in the days prior to the workshop. Due to the hands on nature of this course the size will be limited to ensure users get adequate time on the instrument.

Date Friday, April 22nd, 2016
Time 9:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Roberto Garcia at rgacia@ncsu.edu.

Apr 8th, 2016 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Date Friday, Apr 8th, 2016
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu

Course limited to 6 people.