Aug 19th 2016 – Welcome Lunch for Students and AIF Open House

Analytical Instrumentation Facility (AIF) at NC State University will host a welcome lunch for students and facility and open house on Friday afternoon August 19th, 2016. All invited, and this is particularly useful for new graduate students! This includes an informal lunch from noon to 1 pm, an introductory presentation of AIF lab and instrumentation followed by an AIF facility tour from 1 – 3 pm . Please register using the form below. Registration is required.

Welcome Lunch and AIF Open House

Welcome Lunch and AIF Open House

 

Date Friday, August 19th, 2016
Time 12:00 PM – 3:00 PM
Location 136 Monteith Research Center, Centennial Campus of North Carolina State University

Sep 30th, 2016 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Date Friday, Sep 30th, 2016
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu

Course limited to 6 people.

Sep 23th, 2016 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours theory component on Morning (9:00 am to 11:o0 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic Diffraction and Imaging.
  3. Introduction of the advanced characterization techniques.

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

 

Date Friday, Sep 23th, 2016
Time 9:00 am – 5:00 PM
Location Lab: Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University (Lecture location is to be determined)
Cost NCSU student $50; non-profit $50; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu.