Feb 19, 2016 – First Analytical Inquiry Friday

NCSU’s Analytical Instrumentation Facility (AIF) is kicking off our first Analytical Inquiry Friday (AIF) on Feb 19th, 2016. This Inquiry Friday is meant for those who are interested in getting to know the analytical techniques. Attendants are welcome to bring their own samples to run during the session.

Our first Analytical Inquiry Friday will open surface analytical tool XPS and TOF SIMS in the morning and XRD in the afternoon.

 

Date Friday, Feb 19th, 2016
Time 9:00 am – 12:00 pm (XPS and TOF SIMS)

1:00 pm – 4:00 pm (XRD)

Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost Free

 

For XPS and TOF SIMS registration, please contact Elaine Zhou at czhou@ncsu.edu

For XRD registration, please contact Ching-Chang Chung at cchung4@ncsu.edu

 

Apr 8th, 2016 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Date Friday, Apr 8th, 2016
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu

Course limited to 6 people.

Mar 4th, 2016 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component (taught by Assoc. Prof. Jacob Jones), 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at https://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).

Date Friday, March 4th, 2016
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.

Example of XRD data: XRD example