July 27, 2018 – Educational AFM User Workshop

Continue to discover how AFM can quantify nanomechanical properties to further benefit your research.  In Part 2 of our 3 part series, we’ll discuss the following topics:

 

  • In-liquid Imaging
  • Force Spectroscopy
  • Nanomechanics on soft materials

 

 

Date Friday, July 27, 2018
Time Technical Presentation: 10am; hands on demonstration to follow
Location 463 Monteith Research Center, Centennial Campus of North Carolina State University
Cost Free

For more details and to register, please contact Ryan Fuierer at ryan.fuierer@oxinst.com or Chuck Mooney at cbmooney@ncsu.edu.

Join our Team! Postdoc Opening in Electron Microscopy at AIF

The Analytical Instrumentation Facility (AIF) has an immediate opening for a postdoc in electron microscopy. The position description can be found here. In addition to providing training and service to our dynamic user base, the postdoc will collaborate with users on several projects, develop and publish new techniques, and deliver seminars and short courses. The postdoc will primarily work with the FEI Talos, FEI Titan, FEI Quanta, and FEI Verios instruments.

 

 

AIF Cool Science Seminar Series: Dr. Semën Gorfman

July 20, 2018 @ 3:30 pm – 5:00 pm

Hunt Library room 4106

 

Come grab a bowl of Howling Cow Ice Cream and join us for a talk in the AIF Seminar Series. Dr. Semen Gorfmansenior lecturer at the Materials Science and Engineering department at Tel Aviv University, will present time resolved x-ray diffraction for materials science (abstract below). The AIF Seminar Series is designed to be informal, interactive, and fun. There will be plenty of opportunities to discuss science and network.

Please RSVP here by July 16, 2018.

Time-resolved X-ray diffraction for materials science

 

Abstract

X-ray crystallography is the versatile and rapidly developing area of natural science. While holding its intrinsic cross-disciplinary appeal, it supplies invaluable characterization tools for solid-state physicists, materials scientists, chemists and biologist. While many methods of X-ray crystallography (as e.g. standard structure solution) are becoming routine, the new generation synchrotron radiation sources and X-ray free electron lasers call for the rapid development time-resolved X-ray crystallography. This is relatively new branch of crystallography, which is by far less established and which aims for the set of tools to access time-dependent changes of materials (micro-) structure under external perturbation.

This talk will highlight some synchrotron-based techniques of time-resolved X-ray diffraction and demonstrate how it helps to understand important functions of materials, whose response to external perturbation underpins practically important physical properties. We will especially focus at the structural mechanisms of enhancement of piezoelectricity, dielectricity and ferroelectricity – the properties, which describe response of crystalline materials to the variation of external electric field on the microsecond and millisecond time scales.

Short Biography

Dr Semën Gorfman is the senior lecturer at the Materials Science and Engineering department at Tel Aviv University. He received his MSc in Physics from Chelyabinsk State University (Russia) and obtained PhD in Solid State Physics from the University of Siegen (Germany). In 2008-2011 he worked as a postdoc in the University of Warwick (United Kingdom), in  2011-2016 / 2016-2017 was a lecturer in the Universities of Siegen / Freiburg (Germany). His research interest and expertise span fundamental and X-ray crystallography, physical properties of crystals, piezoelectrics and ferroelectrics, high-resolution X-ray diffraction and precise structure analysis, in-situ X-ray diffraction studies of crystalline materials under external perturbation, application of synchrotron radiation. The research of Dr Gorfman are frequently performed at central synchrotron radiation facilities as ESRF, PETRA III and Diamond Light Source.

Jul 20th, 2018 – FIB Short Course

FIB short course

AIF is going to offer another FIB short course in July 20th, 2018. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

Date Friday, July 20th 2018
Time 8:30 am – 5:30 pm
Location 324 Monteith Research Center, NCSU Centennial Campus
Registration cost (student and non-profit) $50
Registration cost (industry) $350

 

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu.

June 22, 2018 – Educational AFM User Workshop

Discover how AFM can benefit your research. In this workshop, the Origin+ AFM at NCSU’s AIF will be showcased, presenting its scan modes & real-world results. See techniques demonstrated by Asylum Research staff in afternoon.

 

Topics include:

  • AFM for polymer surface characterization
  • AM-FM™ viscoelastic imaging

AM-FM image of a Ternary Polymer (Polystyrene, Polypropylene, Polyethylene) imaged with AM-FM Viscoelastic mapping mode. Image shows topography with an overlay of sample stiffness.

Date Friday, June 22, 2018
Time Technical Presentation: 10am; hands on demonstration to follow
Location 463 Monteith Research Center, Centennial Campus of North Carolina State University
Cost Free

For more details and to register, please contact Ryan Fuierer at ryan.fuierer@oxinst.com or Chuck Mooney at cbmooney@ncsu.edu.

Sep 7th, 2018 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

 

Date Friday, Sep 7th, 2018
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.

Example of XRD data: XRD example