Instrumentation & Rates

 

Scanning Electron Microscopy (SEM) Focused Ion Beam
Transmission Electron Microscopy (TEM) X-ray Diffraction (XRD)
X-Ray Photoelectron Spectroscopy (XPS) Time-of-Flight SIMS – ION-TOF SIMS 5
Atomic Force Microscope (AFM) Surface Profilometry
Nanoindentation Confocal Raman Microscope
Sample Preparation Lab

 

X-ray Tomography

 

AIF Rates

Internal Rates

External Rates

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