Instrumentation & Rates

 

Scanning Electron Microscopy (SEM)	Focused Ion Beam
Transmission Electron Microscopy (TEM)	X-ray Diffraction (XRD)
X-Ray Photoelectron Spectroscopy (XPS)	Time-of-Flight SIMS – ION-TOF SIMS 5
Atomic Force Microscope (AFM)	Surface Profilometry
Nanoindentation	Confocal Raman Microscope

Materials Sample Preparation Lab

 

Bio Sample Preparation Lab

 

X-ray Tomography

 

AIF Rates

Internal Rates

 

External Rates