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June 2019
SEM Short Course
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running…
Find out more »Surface Analysis (XPS and ToF-SIMS) Short Course
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover…
Find out more »August 2019
SEM Short Course
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running…
Find out more »September 2019
SEM Short Course
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running…
Find out more »November 2019
SEM Short Course
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running…
Find out more »