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Surface Analysis (XPS and ToF-SIMS) Short Course
Surface Analysis (XPS and ToF-SIMS) Short Course
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover...
$50