AIF will offer SEM Short Course in a regular basis. Please check the recent news for upcoming course.
The scheduled SEM short course for 2017 are Feb 24, Mar 24, Apr 28, May 19, Jun 23, Sep 22, Oct 27.
NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means. This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants.
|Date||Friday, Mar 24th, 2017|
|Time||8:00 am – 5:00 pm|
|Location||318 Monteith Research Center, Centennial Campus of North Carolina State University|
|Cost||NCSU student $50; non-profit $50; industry $350|
For more details and to register, please contact Chuck Mooney at email@example.com.
If there is enough demand, additional course dates can be added.