XPS/UVS – SPECS System with PHOIBOS 150 Analyzer

X-Ray Photoelectron Spectroscopy (XPS) is a surface analysis technique that can provide elemental and chemical bonding information from the very top surface of a specimen. The specimen is bombarded with X-Rays and emitted electrons are energy analyzed. Most of the signal arises from the first few monolayers. Elemental characterization of the surface can be achieved with about 0.1% detection limit and chemical bonding information can be obtained from differences in binding energy. The cleanliness of the sample and the storage container is very important.

SPECS XPS	Sample Stage

Questions? Contact Elaine Zhou at czhou@ncsu.edu.
Location: MRC room 320

Equipment Specifications