XPS/UVS – SPECS System with PHOIBOS 150 Analyzer
X-Ray Photoelectron Spectroscopy (XPS) is a surface analysis technique that can provide elemental and chemical bonding information from the very top surface of a specimen. The specimen is bombarded with X-Rays and emitted electrons are energy analyzed. Most of the signal arises from the first few monolayers. Elemental characterization of the surface can be achieved with about 0.1% detection limit and chemical bonding information can be obtained from differences in binding energy. The cleanliness of the sample and the storage container is very important.
|SPECS XPS||Sample Stage|
Questions? Contact Elaine Zhou at firstname.lastname@example.org.
Location: MRC room 320