Jan 26th, 2018 – FIB Short Course

FIB short course

AIF is going to offer another FIB short course in Jan 26th, 2018. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

Date Friday, Jan 26th 2018
Time 8:30 am – 5:30 pm
Location 324 Monteith Research Center, NCSU Centennial Campus
Registration cost (student and non-profit) $50
Registration cost (industry) $350

 

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu.

Jan 26th, 2018 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component, 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details at https://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).

Date Friday, Jan 26th, 2018
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.

Example of XRD data: XRD example

Jan 19th, 2018 – CryoSEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Cryogenic Scanning Electron Microscopy (SEM) on a routine basis.  There is a 1.5 hr lecture on CryoSEM theory, application and sample preparation. Each student will get hands-on time (90 minute or more per student) for preparing CryoSEM samples and running the AIF JEOL JSM-7600 SEM.  The goal of the course is to provide students a basic understanding of both theory and practice.  To insure each student receives maximum hands-on time, the course will be limited to 4 participants.

Date Friday, Jan 19th, 2018
Time 9:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

For more details and to register, please contact Chuanzhen Zhou at czhou@ncsu.edu.