Jun 15th, 2018 – SEM Short Course

SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants.

Date Friday, June 15th, 2018
Time 8:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.

If there is enough demand, additional course dates can be added.

June 8th, 2018 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

Date Friday, June 8th, 2018
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Dr. Chuanzhen Elaine Zhou at her email czhou@ncsu.edu

Course limited to 6 people.

May 25th, 2018 – FIB Short Course

FIB short course

AIF is going to offer another FIB short course in May 25th, 2018. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 4 participants.

Date Friday, May 25th 2018
Time 8:30 am – 5:30 pm
Location 324 Monteith Research Center, NCSU Centennial Campus
Registration cost (student and non-profit) $50
Registration cost (industry) $350

 

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu.