FIB Short Course – Slice and View Demonstration
This course will show how to set up a Slice and View experiment where the sample is serial sectioned with the ion beam. The collected...
This course will show how to set up a Slice and View experiment where the sample is serial sectioned with the ion beam. The collected...
This introductory XRD short course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (typically used for powders), and basic phase...
This will be a virtual short course that involves a morning lecture followed by an afternoon FIB Demo. If you have any questions, please email...
The Analytical Instrumentation Facility (AIF) is offering a short course on practical Scanning Electron Microscopy (SEM). The goal of the course is to provide students...
The Analytical Instrumentation Facility (AIF) is offering a short course on practical Scanning Electron Microscopy (SEM). The goal of the course is to provide students...