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Surface Analysis (XPS and ToF-SIMS) Short Course

320 Monteith Research Center 2410 Campus Shore Drive, Monteith Research Center, Room 320, Raleigh

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover...

$50

SEM Short Course

321 Monteith Research Center 2410 Campus Shore Drive, Room 321, Raleigh

We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running...

$50