Continue to discover how AFM can quantify nanomechanical properties to further benefit your research. In Part 2 of our 3 part series, we’ll discuss the following topics: In-liquid...
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student...
Please join us for our annual Open House & User Appreciation. During this time, we'll have an introduction for new users (presented by Dr....
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory...
