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Surface Analysis (XPS and ToF-SIMS) Short Course

September 28, 2018 @ 8:30 am - 4:00 pm

$50

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture.

For more details and to register, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.”

*Industry cost: $350

Details

Date:
September 28, 2018
Time:
8:30 am - 4:00 pm
Cost:
$50
Event Categories:
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Event Tags:
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Venue

320 Monteith Research Center
2410 Campus Shore Drive, Monteith Research Center, Room 320
Raleigh, NC 27606 United States
+ Google Map
Phone:
9195158887

Organizer

Elaine Zhou
Phone:
919-515-4234
Email:
czhou@ncsu.edu
Website:
https://www.aif.ncsu.edu/people/elaine/