The AIF Surface Science Laboratory hosts new instrumentation: a SPECS XPS and an ION-TOF TOF.SIMS5 secondary ion mass spectrometer. These two instruments provide complementary surface analysis information. The XPS indicates elemental and bonding information at the surface with a detection limit of approximately 0.1% atomic, as well as bonding information. TOF-SIMS is more sensitive and can identify organic species. Recent analyses have covered a wide range of applications such as wood components, textile fibers, and semiconductor structures.

Click here for a more elaborated description of ToF SIMS technique.

Click here for a more elaborated description of XPS technique.