Time-of-Flight SIMS – ION-TOF SIMS 5

The ION TOF TOF-SIMS⁵ Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) is a highly sensitive surface analytical technique, using a pulsed and focused ion beam and time-of-flight analyzer to produce positive and negative mass spectra and mass spectral images from the outer 1 to 2nm of materials. It is capable of providing detailed information about the molecular structure of surfaces. Imaging TOF SIMS provides spatial distribution of different species to yield surface reactivity maps. Its high mass resolution and high mass range makes this system adept at both elemental and molecular surface analysis. Data can collected in a “static” mode with minimal damage to the sample surface or in depth profile mode for in depth elemental and, in many cases, molecular analysis.

retrospective analysis allows to show images of ions of interest and spectra of areas of interest