The AIF X-ray Diffraction Laboratory provides access to 3 state-of-the-art X-ray diffractometers for characterizing microstructural and crystallographic properties of powders, thin films, fibers and other solid materials.

  • Rigaku SmartLab X-ray diffractometer has interchangeable stages and optical components that allow 3 operating modes: 1. Bragg-Brentano in reflection geometry for solid materials. 2. Grazing incidence angle diffraction for polycrystalline thin films. 3. X-ray reflectivity for characterizing thin film thickness, roughness, and density.
  • Our PANalytical Empyrean is equipped with 3 different non-ambient stages that will allow in situ measurements of annealing and reactions in the temperature range from -193oC to 2300oC in different atmospheres. It also has a spinning stage that can be operating in reflection and transmission geometries at room temperature.
  • Bruker AXS General Area Detector Diffraction System (GADDS) at AIF equipped with a High-Star area detector and a Four-circle Eulerian cradle that allow for rapid analysis of polycrystalline and single crystalline samples, texture in the samples, and coarse-grained materials.

For a more elaborated XRD technique description, please refer to this document written by AIF XRD expert BB Ching-Chang Chung.