Surface Analysis (XPS and ToF-SIMS) Short Course
320 Monteith Research Center 2410 Campus Shore Drive, Monteith Research Center, Room 320, RaleighNCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory...
$50
